Quantum metrology and sensing: Landscape study on patent filing
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European Patent Office
PatentsQuantum metrology and sensing
This study conducted by the European Patent Office shows that the number of patent filings for second-generation quantum metrology and sensing devices is still small but has recently started to grow. It also reveals that a large propor- tion of the patent filings in this field come from academia, suggesting that researchers still account for most knowl- edge and exploitation of quantum physics.