TY  - GEN 
AU  - Clarke, Nigel S.
AU  - Dias, Julia de Moreira
AU  - Jürgens, Björn
AU  - Herrero Solana, Víctor
PY  - 2019
UR  - http://hdl.handle.net/10481/62830
AB  - This study conducted by the European Patent Office shows that the number of patent filings for second-generation quantum metrology and sensing devices is still small but has recently started to grow. It also reveals that a large propor- tion of the...
LA  - eng
PB  - European Patent Office
KW  - Patents
KW  - Quantum metrology and sensing
TI  - Quantum metrology and sensing: Landscape study on patent filing
DO  - 10.5281/zenodo.3488493
ER  -