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   <ow:Publication rdf:about="oai:digibug.ugr.es:10481/62830">
      <dc:title>Quantum metrology and sensing: Landscape study on patent filing</dc:title>
      <dc:creator>Clarke, Nigel S.</dc:creator>
      <dc:creator>Dias, Julia de Moreira</dc:creator>
      <dc:creator>Jürgens, Björn</dc:creator>
      <dc:creator>Herrero Solana, Víctor</dc:creator>
      <dc:subject>Patents</dc:subject>
      <dc:subject>Quantum metrology and sensing</dc:subject>
      <dc:description>This study conducted by the European Patent Office shows that the number of patent filings for second-generation quantum metrology and sensing devices is still small but has recently started to grow. It also reveals that a large propor- tion of the patent filings in this field come from academia, suggesting that researchers still account for most knowl- edge and exploitation of quantum physics.</dc:description>
      <dc:date>2020-07-02T11:43:53Z</dc:date>
      <dc:date>2020-07-02T11:43:53Z</dc:date>
      <dc:date>2019</dc:date>
      <dc:type>info:eu-repo/semantics/report</dc:type>
      <dc:identifier>http://hdl.handle.net/10481/62830</dc:identifier>
      <dc:identifier>10.5281/zenodo.3488493</dc:identifier>
      <dc:language>eng</dc:language>
      <dc:rights>http://creativecommons.org/licenses/by-sa/3.0/es/</dc:rights>
      <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
      <dc:rights>Atribución-CompartirIgual 3.0 España</dc:rights>
      <dc:publisher>European Patent Office</dc:publisher>
   </ow:Publication>
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