Patent indicators for the Spanish Nanotechnology domain

Abstract

This poster presents the indicators of a patentometric study of Spanish nanotechnology [1] that was presented in a Nanotech Event [2]. The analysis was conducted for the years 2004 to 2014 and the search strategy was based on keywords of a established query [3] and relevant patent classifications. As a patent data source the database Espacenet-Worldwide from the European Patent Office was used since a previous study from the authors showed that it provided the best data coverage for the purpose of the study [4]. More than 3400 patent records with Spanish authorship were retrieved and after an exhaustive data harmonization process a patentometric analysis was performed using the software tool Matheo Patent. For a patent/paper comparison furthermore scientific article data was retrieved from Scopus. Subsequently several indicators were generated which we grouped into the following types: Performance Indicators, Technology network indicators, Collaboration indicators and Patent value indicators.