Patent indicators for the Spanish Nanotechnology domain
Metadata
Show full item recordEditorial
Universidad Politécnica de Valencia
Materia
Nanotechnology Patents Indicators Collaboration indicators European Patent Office Poster
Date
2016Referencia bibliográfica
Herrero-Solana, V.; Jürgens, B. Patent indicators for the Spanish Nanotechnology domain. In: 21st International Conference on Science and Technology Indicators (STI 2016): "Peripheries, frontiers and beyond". Valencia, 14-16 september, 2016. [http://hdl.handle.net/10481/42568]
Sponsorship
We would like to thank the Spanish Ministry of Education for funding the framework project „Technology Watch of Spanish Nanotechnology via its patents“ (Project number: CSO2012-38801) for which this analysis was used.Abstract
This poster presents the indicators of a patentometric study of Spanish nanotechnology [1] that was presented in a Nanotech Event [2]. The analysis was conducted for the years 2004 to 2014 and the search strategy was based on keywords of a established query [3] and relevant patent classifications. As a patent data source the database Espacenet-Worldwide from the European Patent Office was used since a previous study from the authors showed that it provided the best data coverage for the purpose of the study [4]. More than 3400 patent records with Spanish authorship were retrieved and after an exhaustive data harmonization process a patentometric analysis was performed using the software tool Matheo Patent. For a patent/paper comparison furthermore scientific article data was retrieved from Scopus. Subsequently several indicators were generated which we grouped into the following types: Performance Indicators, Technology network indicators, Collaboration indicators and Patent value indicators.