Patent indicators for the Spanish Nanotechnology domain Herrero Solana, Víctor Jürgens, Björn Nanotechnology Patents Indicators Collaboration indicators European Patent Office Poster This poster presents the indicators of a patentometric study of Spanish nanotechnology [1] that was presented in a Nanotech Event [2]. The analysis was conducted for the years 2004 to 2014 and the search strategy was based on keywords of a established query [3] and relevant patent classifications. As a patent data source the database Espacenet-Worldwide from the European Patent Office was used since a previous study from the authors showed that it provided the best data coverage for the purpose of the study [4]. More than 3400 patent records with Spanish authorship were retrieved and after an exhaustive data harmonization process a patentometric analysis was performed using the software tool Matheo Patent. For a patent/paper comparison furthermore scientific article data was retrieved from Scopus. Subsequently several indicators were generated which we grouped into the following types: Performance Indicators, Technology network indicators, Collaboration indicators and Patent value indicators. 2016-09-19T06:02:18Z 2016-09-19T06:02:18Z 2016 conference output Herrero-Solana, V.; Jürgens, B. Patent indicators for the Spanish Nanotechnology domain. In: 21st International Conference on Science and Technology Indicators (STI 2016): "Peripheries, frontiers and beyond". Valencia, 14-16 september, 2016. [http://hdl.handle.net/10481/42568] http://hdl.handle.net/10481/42568 10.13140/RG.2.2.15024.97288 eng open access Universidad Politécnica de Valencia