Modeling of van der Waals-Based Photovoltaic Devices
Metadatos
Mostrar el registro completo del ítemAutor
Díaz Burgos, Ángel Alonso; González Marín, Enrique; Pasadas Cantos, Francisco; García Ruiz, Francisco Javier; Godoy Medina, AndrésEditorial
IEEE
Materia
Device simulation 2D materials Van der Waals heterostructures
Fecha
2025-02-14Referencia bibliográfica
Á. A. Díaz-Burgos, E. G. Marin, F. Pasadas, F. G. Ruiz and A. Godoy, "Modeling of van der Waals-Based Photovoltaic Devices," in IEEE Journal of the Electron Devices Society, vol. 13, pp. 219-227, 2025, [doi: 10.1109/JEDS.2025.3542168]
Patrocinador
Research project CNS2023-143727 RECAMBIO funded by MCIN/AEI/10.13039/501100011033; European Union NextGenerationEU/PRTR; Research projects PID2023-150162OB-I00 and TED2021-129769B-I00 FlexPowHar funded by MCIN/AEI/10.13039/501100011033; P21_00149 ENERGHENE funded by Consejería de Universidad, Investigación e Innovación de la Junta de Andalucía; R+D+i project A-ING-253-UGR23 AMBITIONS co-financed by Consejería de Universidad, Investigación e Innovación; European Union under the FEDER Andalucía 2021-2027Resumen
Two-dimensional Transition Metal Dichalcogenide-based van der Waals heterostructures have
been proposed for avant-garde, highly scalable optoelectronic and excitonic devices. Although ab initio
techniques have been thoroughly employed to analyze these confined systems from a microscopic
perspective, a robust mesoscopic description for device-scale simulation is still lacking. In this work,
we account for the recent reports on the role of interlayer excitons and the band alignment in van der
Waals-based optoelectronic devices, developing an extended van Roosbroeck system within the framework
of the Drift-Diffusion approximation. Ultrafast interlayer charge transfer of photo-generated carriers is
incorporated effectively, as is interlayer recombination. This description succeeds in reproducing selected
experimental measurements of a van der Waals-based gated-diode, providing a comprehensive physical
description of the involved magnitudes.