Mostrar el registro sencillo del ítem

dc.contributor.authorGuerrero-Félix, Jesús Gerardo
dc.contributor.authorLópez-Miras, Javier
dc.contributor.authorRodríguez Valverde, Miguel Ángel 
dc.contributor.authorMoraila-Martínez, Carmen Lucía
dc.contributor.authorFernández Rodríguez, Miguel Ángel 
dc.date.accessioned2023-09-19T09:38:16Z
dc.date.available2023-09-19T09:38:16Z
dc.date.issued2023-09
dc.identifier.citationJ.G. Guerrero-Felix et al. Automation of an atomic force microscope via Arduino. HardwareX 15 (2023) e00447. [https://doi.org/10.1016/j.ohx.2023.e00447]es_ES
dc.identifier.urihttps://hdl.handle.net/10481/84496
dc.descriptionThe Dimension 3000 AFM used in this work was kindly donated by Prof. Nicholas D. Spencer, and facilitated by Prof. Lucio Isa, and Dr. Shivaprakash N. Ramakrishna, from ETH-Zurich. We thank Prof. David Cuartielles for encouraging us to publish this work in this special issue on Arduino Science Hardware. We also thank Llorenc Mercadal Fernandez for frutiful discussions and ideas, and the BiblioMaker unit in the Faculty of Sciences of the University of Granada for their help in 3D printing the gears used here. MAFR acknowledges support by the project PID2020-116615RA-I00 funded by MCIN/AEI/10.13039/501100011033, and the EMERGIA grant with reference EMC21_00008 funded by Consejeria de Universidad, Investigacion e Innovacion de la Junta de Andalucia, and by FEDER "ERDF A way of making Europe". JGGF and CLMM acknowledge support from grant A1S35536 by Conacyt Mexico.es_ES
dc.description.abstractThe Atomic Force Microscopy is a very versatile technique that allows to characterize surfaces by acquiring topographies with sub-nanometer resolution. This technique often overcomes the problems and capabilities of electron microscopy when characterizing few nanometers thin coatings over solid substrates. They are expensive, in the half million dollar range for standard units, and therefore it is often difficult to upgrade to new units with improved characteristics. One of these improvements, motorization and automation of the measurements is very interesting to sample different parts of a substrate in an unattended way. Here we report a low cost upgrade under 60 $ to a Dimension 3000 AFM based on a control unit using an Arduino Leonardo. It enables to acquire dozens or hundreds of images automatically by mimicking keyboard shortcuts and interfacing the AFM PCI card.es_ES
dc.description.sponsorshipMCIN/AEI PID2020-116615RA-I00es_ES
dc.description.sponsorshipConsejeria de Universidad, Investigacion e Innovacion de la Junta de Andalucia EMC21_00008es_ES
dc.description.sponsorshipMarie Curie Actionses_ES
dc.description.sponsorshipConsejo Nacional de Ciencia y Tecnologia (CONACyT) A1S35536es_ES
dc.language.isoenges_ES
dc.publisherElsevieres_ES
dc.rightsAtribución 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/*
dc.subjectArduinoes_ES
dc.subjectLow-cost automationes_ES
dc.subjectAtomic force microscopees_ES
dc.titleAutomation of an atomic force microscope via Arduinoes_ES
dc.typejournal articlees_ES
dc.rights.accessRightsopen accesses_ES
dc.identifier.doi10.1016/j.ohx.2023.e00447
dc.type.hasVersionVoRes_ES


Ficheros en el ítem

[PDF]

Este ítem aparece en la(s) siguiente(s) colección(ones)

Mostrar el registro sencillo del ítem

Atribución 4.0 Internacional
Excepto si se señala otra cosa, la licencia del ítem se describe como Atribución 4.0 Internacional