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Methodology for Improving Scanning Performance Loading an Array Element with a 3D All-Metal WAIM
dc.contributor.author | Bermúdez Martín, Diego | |
dc.contributor.author | Molero Jiménez, Carlos | |
dc.date.accessioned | 2022-10-14T11:24:40Z | |
dc.date.available | 2022-10-14T11:24:40Z | |
dc.date.issued | 2022-09-09 | |
dc.identifier.citation | Bermúdez-Martín, D... [et al.]. Methodology for Improving Scanning Performance Loading an Array Element with a 3D All-Metal WAIM. Electronics 2022, 11, 2848. [https://doi.org/10.3390/electronics11182848] | es_ES |
dc.identifier.uri | https://hdl.handle.net/10481/77318 | |
dc.description.abstract | All-metal 3D printing technologies are allowing the conception of new structures for different applications. This publication explores the potential of employing for the first time an all-metal 3D unit-cell topology to perform wide-angle impedance matching layers. A new equivalent circuit is derived for the oblique incidence, providing a good estimation of the cell response for the scanning range (theta = [0 degrees, 55 degrees]) in the main scanning planes for a linearly polarized radiated field. This analytical model is later used to develop a wide-angle impedance matching design methodology for a generic antenna. This methodology is tested in practice to match a phased array made of metallic horns at 18 GHz. An improvement of 5 dB is obtained in the simulations for angles theta > 35 degrees for the H -plane. | es_ES |
dc.description.sponsorship | European Union through the European Regional Development Fund (ERDF) | es_ES |
dc.description.sponsorship | french region of Brittany | es_ES |
dc.description.sponsorship | Conseil Departemental 35 through the CPER Project SOPHIE/STIC Ondes | es_ES |
dc.description.sponsorship | Ministry of Higher Education & Scientific Research (MHESR) | es_ES |
dc.description.sponsorship | Thales Group | es_ES |
dc.description.sponsorship | Region Bretagne | es_ES |
dc.language.iso | eng | es_ES |
dc.publisher | MDPI | es_ES |
dc.rights | Atribución 4.0 Internacional | * |
dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | * |
dc.subject | Equivalent circuit | es_ES |
dc.subject | Improving scanning | es_ES |
dc.subject | TEM waveguide unit-cell | es_ES |
dc.subject | 3D all-metal | es_ES |
dc.title | Methodology for Improving Scanning Performance Loading an Array Element with a 3D All-Metal WAIM | es_ES |
dc.type | journal article | es_ES |
dc.rights.accessRights | open access | es_ES |
dc.identifier.doi | 10.3390/electronics11182848 | |
dc.type.hasVersion | VoR | es_ES |