STOOD-X: Explainable out-of-distribution detection via nonparametric statistical testing on large-scale datasets
Metadatos
Mostrar el registro completo del ítemEditorial
Elsevier
Materia
Explainable Artificial Intelligence Deep Learning Out-of-distribution
Fecha
2026-09Referencia bibliográfica
Sevillano-García, I., Luengo, J., & Herrera, F. (2026). STOOD-X: Explainable out-of-distribution detection via nonparametric statistical testing on large-scale datasets. Pattern Recognition, 177(113254), 113254. https://doi.org/10.1016/j.patcog.2026.113254
Patrocinador
European Union Next Generation through the Ministry for Digital Transformation and the Civil Service - (TSI-100927-2023-1); MCIN/AEI/10.13039/501100011033 - (PID2023-150070NB-I00); Universidad de Granada / CBUA - (Open access charge)Resumen
Out-of-distribution (OOD) detection is a critical task in machine learning, particularly in safety-sensitive appli
cations where model failures can have serious consequences. However, current OOD detection methods often
suffer from restrictive distributional assumptions, limited scalability, and a lack of interpretability. To address
these challenges, we propose STOOD-X, a two-stage methodology that combines a Statistical nonparametric Test
for OOD Detection with eXplainability enhancements. In the first stage, STOOD-X uses feature-space distances
and a Wilcoxon-Mann-Whitney test to identify OOD samples without assuming a specific feature distribution. In
the second stage, it generates user-friendly, concept-based visual explanations that reveal the features driving
each decision, aligning with the BLUE XAI paradigm. Through extensive experiments on benchmark datasets
and multiple architectures, STOOD-X achieves competitive performance compared to state-of-the-art post hoc
OOD detectors, particularly in high-dimensional and complex settings. In addition, its explainability framework
enables human oversight, bias detection, and model debugging, fostering trust and collaboration between hu
mans and AI systems. Therefore, STOOD-X offers a robust, explainable, and scalable solution for real-world OOD
detection tasks





