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      <dc:title>TEM in Geology. Basics and applications</dc:title>
      <dc:creator>Nieto García, Fernando</dc:creator>
      <dc:subject>Transmission electron microscopy</dc:subject>
      <dc:subject>Electron diffraction</dc:subject>
      <dc:subject>Ion milling</dc:subject>
      <dc:subject>Geology</dc:subject>
      <dc:subject>Mineralogy</dc:subject>
      <dc:subject>Lattice images</dc:subject>
      <dc:subject>Electron crystallography</dc:subject>
      <dc:subject>Analytical electron microscopy</dc:subject>
      <dc:subject>AEM</dc:subject>
      <dc:date>2020-11-10T13:10:34Z</dc:date>
      <dc:date>2020-11-10T13:10:34Z</dc:date>
      <dc:date>2008</dc:date>
      <dc:type>info:eu-repo/semantics/bookPart</dc:type>
      <dc:identifier>Instrumental techniques applied to Mineralogy and Geochemistry  (I. Subias, and B. Bauluz, eds.):  21-42</dc:identifier>
      <dc:identifier>http://hdl.handle.net/10481/64178</dc:identifier>
      <dc:language>eng</dc:language>
      <dc:relation>Seminarios de la Sociedad Española de Mineralogía;</dc:relation>
      <dc:rights>http://creativecommons.org/licenses/by-nc-nd/3.0/es/</dc:rights>
      <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
      <dc:rights>Atribución-NoComercial-SinDerivadas 3.0 España</dc:rights>
      <dc:publisher>Sociedad Española de Mineralogía</dc:publisher>
   </ow:Publication>
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