Physics-based scalable compact model for terminal charge, intrinsic capacitance and drain current in nanosheet FETs
Identificadores
URI: https://hdl.handle.net/10481/91037Metadatos
Mostrar el registro completo del ítemMateria
Terminal charges Nanosheet FET Ward-Dutton Quantum confinement Bottom-up scalable compact model
Fecha
2024Referencia bibliográfica
Published version: Singh, Aishwarya; Ganeriwala, Mohit Dineshkumar; Mohapatra, Nihar. Physics-based scalable compact model for terminal charge, intrinsic capacitance and drain current in nanosheet FETs. 2024
Resumen
This work presents a physics-based SPICE compatible model
for Nanosheet FETs, which provides explicit expressions for
the drain current, terminal charges and intrinsic capacitances.
The drain current model is based on the drift-diffusion formalism for carrier transport. The terminal charge and intrinsic capacitance models are calculated by adopting the Ward–Dutton linear charge partition scheme that guarantees charge
conservation. The model uses the novel bottom-up approach
to calculate the terminal charges, uses very few empirical parameters and is accurate across device dimensions and bias
conditions.