Horizontal accuracy assessment of a novel algorithm for approximate a surface to a DEM
Metadata
Show full item recordAuthor
Barrera Rosillo, Domingo; Ibáñez Pérez, María José; Eddargani, Salah; Romero Zaliz, Rocio CelesteEditorial
Copernicus
Materia
Spline Bernstein basis Control points Bézier ordinates Tensor product Resample Horizontal accuracy DEM
Date
2021-12-03Referencia bibliográfica
Barrera, D... [et al.]. Horizontal accuracy assessment of a novel algorithm for approximate a surface to a DEM, Proc. Int. Cartogr. Assoc., 4, 11, [https://doi.org/10.5194/ica-proc-4-11-2021], 2021.
Abstract
This study evaluates the horizontal positional accuracy of a new algorithm that defines a surface that approximates DEM
data by means of a spline function. This algorithm allows evaluating the surface at any point in its definition domain and
allows analytically estimating other parameters of interest, such as slopes, orientations, etc. To evaluate the accuracy
achieved with the algorithm, we use a reference DEM 2 m × 2 m (DEMref) from which the derived DEMs are obtained at
4 m × 4 m, 8 m × 8 m and 16 m × 16 m (DEMder). For each DEMder its spline approximant is calculated, which is evaluated
at the same points occupied by the DEMref cells, getting a resampled DEM 2x2m (DEMrem). The horizontal accuracy is
obtained by computing the area amongs the homologous contour lines derived from DEMref and DEMrem, respectively. It
has been observed that the planimetric errors of the proposed algorithm are very small, even in flat areas, where you could
expect major differences. Therefore, this algorithm could be used when an evaluation of the horizontal positional accuracy
of a DEM product at lower resolution (DEMpro) and a different producing source than the higher resolution DEMref is
wanted.