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Espacenet, Patentscope and Depatisnet: a comparison approach

[PDF] WPI-D-14-00032R1.pdf (572.3Ko)
Identificadores
URI: http://hdl.handle.net/10481/41389
DOI: 10.1016/j.wpi.2015.05.004
ISSN: 0172-2190
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Estadísticas
Statistiques d'usage de visualisation
Metadatos
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Auteur
Jürgens, Björn; Herrero Solana, Víctor
Editorial
Elsevier
Materia
Patents
 
Patent database
 
Open access
 
Espacenet
 
Patentscope
 
Depatisnet
 
Features
 
Comparison
 
Functionalities
 
Free charge
 
Date
2015-06-12
Referencia bibliográfica
Björn, J.; Herrero-Solana, V. Espacenet, Patentscope and Depatisnet: a comparison approach. World Patent Information, 42:4-12 (2015). [http://hdl.handle.net/10481/41389]
Patrocinador
Project "Technology Watch of Spanish Nanotechnology via its patents" (Project number: CSO2012-38801), Spanish Ministry of Education. Grupo de Investigación: SCImago-UGR (SEJ036)
Résumé
Espacenet, Patentscope and Depatisnet are known as the main multinational patent databases offered by patent authorities which are available to the public free of charge. As all three systems have substantially improved in the last few years, a comparison of their functionalities and capabilities, as discussed herein, is useful for those unfamiliar with the recent developments. In order to present the comparison, the following aspects were analysed: data coverage, search functionality, result list, bibliographic view of records and patent data export options. Case studies are presented where the search systems were compared in the field of nanotechnology. The analysis concludes that Espacenet has the best features for searching, Patentscope the best for analysis and Depatisnet the best for complex search tasks.
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