TY  - GEN 
AU  - Acal González, Christian José
AU  - Maldonado Correa, David
AU  - Cantudo Gómez, Antonio
AU  - Bargallo González, Mireia
AU  - Jiménez Molinos, Francisco
AU  - Campabadal, F.
AU  - Roldán, J. B.
PY  - 2024
UR  - https://hdl.handle.net/10481/93250
AB  - A new statistical analysis is presented to assess cycle-to-cycle variability in resistive memories. This method employs two-dimensional (2D) distributions of parameters to analyse both set and reset voltages and currents, coupled with a 2D coefficient...
LA  - eng
PB  - Royal Society of Chemistry
TI  - Variability in HfO2-based memristors described with a new bidimensional statistical technique
DO  - 10.1039/D4NR01237B
ER  -