TY  - GEN 
AU  - Romero Cáceres, Adrián
AU  - Jiménez Tejada, Juan Antonio
AU  - Picos, Rodrigo
AU  - Lara, Diego
AU  - Roldán Aranda, Juan Bautista
AU  - Deen, M. Jamal
PY  - 2024
UR  - https://hdl.handle.net/10481/90837
AB  - In this work, we propose a model that describes the temporal evolution of the threshold voltage and trapped charge density in Thin-Film Transistors (TFTs) under dynamic conditions, paving the way for the characterization and modeling of memory...
LA  - eng
PB  - Elsevier
KW  - Compact modeling
KW  - Contact effects
KW  - Evolutionary parameter extraction method
KW  - Hysteresis
KW  - Thin-Film Transistors (TFTs)
TI  - Compact modeling of hysteresis in organic thin-film transistors
DO  - 10.1016/j.orgel.2024.107048
ER  -