TY  - GEN 
AU  - Maldonado Correa, David
AU  - Aldana Delgado, Samuel
AU  - Cantudo Gómez, Antonio
AU  - Jiménez Molinos, Francisco
AU  - Roldán Aranda, Juan Bautista
PY  - 2023
UR  - https://hdl.handle.net/10481/85489
AB  - The switching dynamics of TiN/Ti/HfO2/W-based resistive memories is investigated. The analysis consisted in
the systematic application of voltage sweeps with different ramp rates and temperatures. The obtained results
give clear insight into the...
LA  - eng
PB  - Elsevier
KW  - Resistive switching
KW  - RRAM
KW  - Operation dynamics
KW  - Characterization
KW  - Kinetic Monte Carlo
KW  - Compact modeling
TI  - A thorough investigation of the switching dynamics of TiN/Ti/10 nm-HfO2/W resistive memories
DO  - 10.1016/j.mssp.2023.107878
ER  -