TY  - GEN 
AU  - Guerrero-Félix, Jesús Gerardo
AU  - López-Miras, Javier
AU  - Rodríguez Valverde, Miguel Ángel
AU  - Moraila-Martínez, Carmen Lucía
AU  - Fernández Rodríguez, Miguel Ángel
PY  - 2023
UR  - https://hdl.handle.net/10481/84496
AB  - The Atomic Force Microscopy is a very versatile technique that allows to characterize surfaces by acquiring topographies with sub-nanometer resolution. This technique often overcomes the problems and capabilities of electron microscopy when...
LA  - eng
PB  - Elsevier
KW  - Arduino
KW  - Low-cost automation
KW  - Atomic force microscope
TI  - Automation of an atomic force microscope via Arduino
DO  - 10.1016/j.ohx.2023.e00447
ER  -