TY  - GEN 
AU  - Aguilera Pedregosa, Cristina
AU  - Maldonado Correa, David
AU  - Jiménez Molinos, Francisco
AU  - Roldán Aranda, Juan Bautista
PY  - 2023
UR  - https://hdl.handle.net/10481/81740
AB  - A methodology to estimate the device temperature in resistive random access memories
(RRAMs) is presented. Unipolar devices, which are known to be highly influenced by thermal effects
in their resistive switching operation, are employed to develop...
LA  - eng
PB  - MDPI
KW  - Resistive switching memory
KW  - RRAM
KW  - Temperature characterization
KW  - Simulation
KW  - Variability
KW  - Modeling
KW  - Kinetic Monte Carlo
KW  - Series resistance
TI  - Thermal Characterization of Conductive Filaments in Unipolar Resistive Memories
DO  - 10.3390/mi14030630
ER  -