TY - JOUR AU - Acal González, Christian José AU - Maldonado Correa, David AU - Aguilera Del Pino, Ana María AU - Roldán Aranda, Juan Bautista PY - 2023 UR - https://hdl.handle.net/10481/81638 AB - We present a new methodology to quantify the variability of resistive switching memories. Instead of statistically analyzing few data points extracted from current versus voltage (I− V) plots, such as switching voltages or state resistances, we... LA - eng PB - American Chemical Society KW - Resistive memories KW - Variability KW - Variability coefficient KW - Functional data analysis KW - Holistic methodology TI - Holistic Variability Analysis in Resistive Switching Memories Using a Two-Dimensional Variability Coefficient DO - 10.1021/acsami.2c22617 ER -