TY  - GEN 
AU  - Hatefinasab, Seyedehsomayeh
AU  - Morales Santos, Diego Pedro
AU  - Castillo Morales, María Encarnación
AU  - Rodríguez Santiago, Noel
PY  - 2023
UR  - https://hdl.handle.net/10481/79822
AB  - This paper presents a low-cost, self-recoverable, double-node upset tolerant latch aiming at
nourishing the lack of these devices in the state of the art, especially featuring self-recoverability while
maintaining a low-cost pro le. Thus, this...
LA  - eng
PB  - IEEE
KW  - Delay-power-area product (DPAP)
KW  - Double node upsets (DNU)
KW  - High impedance state (HIS)
KW  - Low cost single event double node upset tolerant (LSEDUT)
KW  - Power-delay product (PDP)
KW  - Single node upset (SNU)
KW  - Soft error (SE)
TI  - Rule-Based Design for Low-Cost Double-Node Upset Tolerant Self-Recoverable D-Latch
DO  - 10.1109/ACCESS.2022.3233812
ER  -