TY  - JOUR 
AU  - Gámiz Pérez, María Luz
AU  - Raya Miranda, Rocío
PY  - 2022
UR  - http://hdl.handle.net/10481/74505
AB  - Our practical motivation is the analysis of potential correlations between spectral noise current and threshold voltage from
common on-wafer MOSFETs. The usual strategy leads to the use of standard techniques based on Normal linear regression
easily...
LA  - eng
PB  - Springer
KW  - 1/f Noise
KW  - Backfitting algorithm
KW  - Bootstrap
KW  - MOSFET
KW  - SiZer map
KW  - Statistical modeling
TI  - Statistical supervised learning with engineering data: a case study of low frequency noise measured on semiconductor devices
DO  - 10.1007/s00170-022-08949-z
ER  -