TY  - JOUR 
AU  - Maldonado Correa, David
AU  - Aldana Delgado, Samuel
AU  - González, M. B.
AU  - Jiménez Molinos, Francisco
AU  - Ibáñez Pérez, María José
AU  - Barrera Rosillo, Domingo
AU  - Campabadal, F.
AU  - Roldán Aranda, Juan Bautista
PY  - 2022
UR  - http://hdl.handle.net/10481/72821
AB  - We have analyzed variability in resistive memories (Resistive Random Access Memories, RRAMs) making use of advanced numerical techniques to process experimental measurements and simulations based on the kinetic Monte Carlo technique. The devices...
LA  - eng
PB  - Elsevier
KW  - Resistive switching memory
KW  - RRAM
KW  - Parameter extraction
KW  - Kinetic Monte Carlo simulation
KW  - Variability
KW  - Modeling
KW  - Numerical techniques
TI  - Variability estimation in resistive switching devices, a numerical and kinetic Monte Carlo perspective
DO  - 10.1016/j.mee.2022.111736
ER  -