TY  - GEN 
AU  - Maldonado Correa, David
AU  - Aguirre, F.
AU  - González Cordero, Gerardo
AU  - Roldán Aranda, Andrés María
AU  - González, M. B.
AU  - Jiménez Molinos, Francisco
AU  - Campabadal, F.
AU  - Miranda, E.
AU  - Roldán Aranda, Juan Bautista
PY  - 2021
UR  - http://hdl.handle.net/10481/72562
AB  - The relevance of the intrinsic series resistance effect in the context of resistive random access memory (RRAM) compact modeling is investigated. This resistance notably affects the conduction characteristic of resistive switching memories so that it...
LA  - eng
PB  - AIP Publishing
TI  - Experimental study of the series resistance effect and its impact on the compact modeling of the conduction characteristics of HfO2-based resistive switching memories
DO  - 10.1063/5.0055982
ER  -