TY  - GEN 
AU  - Pérez Valero, Eduardo
AU  - Maldonado Correa, David
AU  - Acal González, Christian José
AU  - Ruiz Castro, Juan Eloy
AU  - Alonso Morales, Francisco J.
AU  - Aguilera Del Pino, Ana María
AU  - Jiménez Molinos, Francisco
AU  - Wenger, Christian
AU  - Roldán Aranda, Juan Bautista
PY  - 2019
UR  - http://hdl.handle.net/10481/72295
AB  - In order to study the device-to-device and cycle-to-cycle variability of switching voltages in 4-kbit RRAM arrays, an alternative statistical approach has been adopted by using experimental data collected from a batch of 128 devices switched along...
LA  - eng
PB  - Elsevier
KW  - RRAM Array
KW  - Variability
KW  - Weibull distribution
KW  - Phase-type distribution
TI  - Analysis of the statistics of device-to-device and cycle-to-cycle variability in TiN/Ti/Al:HfO2/TiN RRAMs
DO  - https://doi.org/10.1016/j.mee.2019.05.004
ER  -