TY  - JOUR 
AU  - Roldán Aranda, Juan Bautista
AU  - Alonso Morales, Francisco J.
AU  - Aguilera Del Pino, Ana María
AU  - Maldonado Correa, David
AU  - Lanza, M
PY  - 2019
UR  - http://hdl.handle.net/10481/71827
AB  - Time series statistical analyses (TSSA) have been employed to evaluate the variability of resistive switching memories and to model the set and reset voltages for modeling purposes. The conventional procedures behind time series theory have been used...
LA  - eng
PB  - AIP Publishing
KW  - Resistive switching memory
KW  - RRAM
KW  - Conductive filaments
KW  - Variability
KW  - Time series modelling
KW  - Autocovariance
KW  - Stationary time series
TI  - Time series statistical analysis: A powerful tool to evaluate the variability of resistive switching memories
DO  - https://doi.org/10.1063/1.5079409
ER  -