TY  - JOUR 
AU  - Alonso Morales, Francisco J.
AU  - Maldonado Correa, David
AU  - Aguilera Del Pino, Ana María
AU  - Roldán Aranda, Juan Bautista
PY  - 2021
UR  - http://hdl.handle.net/10481/71825
AB  - A powerful time series analysis modeling technique is presented to describe cycle-to-cycle variability in memristors. These devices show variability linked to the inherent stochasticity of device operation and it needs to be accurately modeled to...
LA  - eng
PB  - Elsevier
KW  - Memristors
KW  - Variability
KW  - Resistive switching memory
KW  - Conductive filaments
KW  - Time series modeling
KW  - Compact modeling
KW  - Autocovariance
TI  - Memristor variability and stochastic physical properties modeling from a multivariate time series approach
DO  - https://doi.org/10.1016/j.chaos.2020.110461
ER  -