TY  - GEN 
AU  - Roldán Aranda, Juan Bautista
AU  - Miranda, E.
AU  - González Cordero, Gerardo
AU  - García Fernández, Pedro
AU  - Romero Zaliz, Rocio Celeste
AU  - González Rodelas, Pedro
AU  - Aguilera Del Pino, Ana María
AU  - González, M. B.
AU  - Jiménez Molinos, Francisco
PY  - 2018
UR  - http://hdl.handle.net/10481/71547
AB  - A multivariate analysis of the parameters that characterize the reset process in RRAMs has been performed. The different correlations obtained can help to shed light on the current components that contribute in the Low Resistance State (LRS) of the...
LA  - eng
PB  - AIP Publishing
KW  - Resistive switching memory
KW  - RRAM
KW  - Quantum Point Contact Model
KW  - Conductive filaments
KW  - Parameter extraction
TI  - Multivariate analysis and extraction of parameters in resistive RAMs using the Quantum Point Contact model
DO  - https://doi.org/10.1063/1.5006995
ER  -