TY  - JOUR 
AU  - Aguilera Morillo, María del Carmen
AU  - Aguilera Del Pino, Ana María
AU  - Jiménez Molinos, Francisco
AU  - Roldán Aranda, Juan Bautista
PY  - 2019
UR  - http://hdl.handle.net/10481/71546
AB  - Resistive Random Access Memories (RRAMs) are being studied by the industry and academia because it is widely accepted that they are promising candidates for the next generation of high density nonvolatile memories. Taking into account the stochastic...
LA  - eng
PB  - Elsevier
KW  - Functional data
KW  - Karhunen–Loève expansion
KW  - Penalized splines
KW  - Resistive switching
KW  - Resistive memories
KW  - Device variability
TI  - Stochastic Modelling of Random Access Memories Reset Transitions
DO  - https://doi.org/10.1016/j.matcom.2018.11.016
ER  -