TY  - JOUR 
AU  - Acal González, Christian José
AU  - Ruiz Castro, Juan Eloy
AU  - Maldonado Correa, David
AU  - Roldán Aranda, Juan Bautista
PY  - 2021
UR  - http://hdl.handle.net/10481/71267
AB  - A new probability distribution to study lifetime data in reliability is introduced in this
paper. This one is a first approach to a non‐homogeneous phase‐type distribution. It is built by
considering one cut‐point in the non‐negative semi‐line of a...
LA  - eng
PB  - MDPI
KW  - One cut‐point phase‐type distribution
KW  - Maximum likelihood
KW  - Estimation
KW  - RRAM
KW  - Variability
TI  - One Cut‐Point Phase‐Type Distributions in Reliability.    An Application to Resistive Random Access Memories
DO  - 10.3390/math9212734
ER  -