TY  - GEN 
AU  - Márquez González, Carlos
AU  - Salazar, Norberto
AU  - Gity, Farzan
AU  - Galdón, José Carlos
AU  - Navarro Moral, Carlos
AU  - Duffy, Ray
AU  - Hurley, Paul
AU  - Gamiz, Francisco Jesús
PY  - 2021
UR  - http://hdl.handle.net/10481/70021
AB  - In this work, the electrical performance and reliability of as-synthesized CVD-grown MoS2 transistors directly grown on SiO2/Si substrate without any transfer process have been evaluated. Transfer and output characteristics, current hysteresis,...
LA  - eng
PB  - ELSEVIER
KW  - Transition Metal Dichalcogenide
KW  - Molybdenum Disulfide
KW  - Two-Dimensional Materials
KW  - More than Moore
KW  - Low-frequency noise
KW  - Reliability
TI  - Performance and reliability in back-gated CVD-grown MoS2 devices
DO  - 10.1016/j.sse.2021.108173
ER  -