TY  - GEN 
AU  - Acal González, Christian José
AU  - Ruiz-Castro, Juan Eloy
AU  - Aguilera Del Pino, Ana María
AU  - Jimenez- Molinos, Francisco
AU  - Roldán Aranda, Juan Bautista
PY  - 2019
UR  - http://hdl.handle.net/10481/69354
AB  - A new statistical approach has been developed to analyze Resistive Random Access Memory (RRAM) variability. The stochastic nature of the physical processes behind the operation of resistive memories makes variability one of the key issues to solve...
LA  - eng
PB  - Elsevier
KW  - Resistive switching memory
KW  - Conductive filaments
KW  - Reset process
KW  - Weibull distribution
KW  - Phase-type distributions
KW  - Statistical modeling
TI  - Phase-type distributions for studying variability in resistve memories
DO  - https://doi.org/10.1016/j.cam.2018.06.010
ER  -