TY  - JOUR 
AU  - Calomarde, Antonio
AU  - Moll, Francesc
AU  - Gámiz Pérez, Francisco Jesús
PY  - 2020
UR  - http://hdl.handle.net/10481/65890
AB  - In this paper, we present a new method to mitigate the effect of the charge collected by trigate
FinFET devices after an ionizing particle impact. The method is based on the creation of an internal structure
that generates an electrical field that...
LA  - eng
PB  - IEEE Inst Electrical Electronics Engineers Inc
KW  - Charge collection
KW  - Single event cross section,
KW  - Radiation hardening
KW  - Soft error
KW  - Single event transient (SET)
KW  - Single event upset (SEU)
KW  - FinFET
KW  - 3D TCAD modeling
TI  - Active radiation-hardening strategy in Bulk FinFETs
DO  - 10.1109/ACCESS.2020.3035974
ER  -