TY  - GEN 
AU  - Picos, Rodrigo
AU  - Roldán Aranda, Juan Bautista
AU  - Al Chawa, Mohamed Moner
AU  - García Fernández, Pedro
AU  - Jiménez Molinos, Francisco
AU  - García-Moreno, Eugeni
PY  - 2015
SN  - 1210-2512
UR  - http://hdl.handle.net/10481/36994
AB  - We have measured the transition process from the high to low resistivity states, i.e., the reset process of resistive switching based memristors based on Ni/HfO2/Si-n+ structures, and have also developed an analytical model for their electrical...
LA  - eng
PB  - Brno University of Technology. Faculty of Electrical Engineering and Communication
KW  - RRAM
KW  - Memristor modeling
KW  - Reset voltage (Vrst) determination
KW  - Variability
TI  - Semiempirical Modeling of Reset Transitions in Unipolar Resistive-Switching Based Memristors
DO  - 10.13164/re.2015.0420
ER  -