TY  - GEN 
AU  - Maldonado Correa, David
AU  - Acal González, Christian José
AU  - Ortiz Alcalá, Helena
AU  - Navas Gómez, Fernando Jesús
AU  - Cantudo Gómez, Antonio Manuel
AU  - Wenger, C.
AU  - Pérez, E.
AU  - Roldán Aranda, Juan Bautista
PY  - 2026
UR  - https://hdl.handle.net/10481/110082
AB  - We have studied device-to-device variability in TiN/Ti/HfO2/TiN devices under pulse operation. We measured extensively memristive devices that are CMOS integrated with different pulse trains, changing the pulse width and amplitude for groups of more...
LA  - eng
PB  - Elsevier
KW  - Resistive switching memory
KW  - Variability
KW  - Distribution function
TI  - Variability in HfO2-based memristors under pulse operation
DO  - 10.1016/j.mee.2026.112445.
ER  -