TY  - GEN 
AU  - Maldonado Correa, David
AU  - Acal González, Christian José
AU  - Ortiz Alcalá, Helena
AU  - Aguilera Del Pino, Ana María
AU  - Ruiz Castro, Juan Eloy
AU  - Cantudo Gómez, Antonio Manuel
AU  - Roldán Aranda, Juan Bautista
PY  - 2025
UR  - https://hdl.handle.net/10481/104123
AB  - The conductance drift in HfO2-based memristors is a critical reliability concern that impacts in their application
in non-volatile memory and neuromorphic computing integrated circuits. In this work we present a comprehensive
statistical analysis of...
LA  - eng
PB  - Elsevier
TI  - A comprehensive statistical study of the post-programming conductance drift in HfO2-based memristive devices
DO  - 10.1016/j.mssp.2025.109668
ER  -