TY  - GEN 
AU  - Cantudo Gómez, Antonio
AU  - Jiménez Molinos, Francisco
AU  - Ruiz, P.Q.
AU  - López, A.
AU  - Villena, M.A.
AU  - González, M.B.
AU  - Campabadal, F.
AU  - Roldán Aranda, Juan Bautista
PY  - 2025
UR  - https://hdl.handle.net/10481/103320
AB  - Variability is a key aspect of memristors that hinders their usage in massive commercial applications. This study investigates the cycle-to-cycle variability of resistive switching devices fabricated using three different dielectric configurations:...
LA  - eng
PB  - Elsevier
TI  - Statistical, simulation and modeling analysis of variability in memristors with single and bilayer dielectrics of HfO2 and Al2O3, a comparison
DO  - 10.1016/j.chaos.2025.116352
ER  -