TY  - GEN 
AU  - Lozano, Helena
AU  - Millan-Solsona, Ruben
AU  - Fabregas, Rene
AU  - Gomila, Gabriel
PY  - 2019
UR  - https://hdl.handle.net/10481/101842
AB  - Sizing natural or engineered single nanoscale objects is fundamental in many areas of science and technology. To achieve it several advanced microscopic techniques have been developed, mostly based on electron and scanning probe microscopies. Still...
LA  - eng
KW  - Electrostatic Force Microscopy (EFM)
KW  - Nanoscale Sizing
KW  - Polarization Forces
KW  - Multiparameter Quantification
KW  - Nano-Modeling
TI  - Sizing single nanoscale objects from polarization forces
ER  -