TY  - GEN 
AU  - Wu, Bi Yi
AU  - Sheng, Xin-Qing
AU  - Fabregas, Rene
AU  - Hao, Yang
PY  - 2017
UR  - https://hdl.handle.net/10481/101795
AB  - A three-dimensional finite element numerical modeling for the scanning microwave microscopy (SMM) setup is applied to study the full-wave quantification of the local material properties of samples. The modeling takes into account the radiation and...
LA  - eng
KW  - Full-wave Modeling
KW  - Scanning Microwave Microscopy (SMM)
KW  - Finite Element Method (FEM)
KW  - Dielectric Spectroscopy
KW  - Radiation and Scattering Losses
TI  - Full-wave modeling of broadband near field scanning microwave microscopy
DO  - 10.1038/s41598-017-13937-5
ER  -