TY  - GEN 
AU  - Van Der Hofstadt, Marc
AU  - Fabregas, Rene
AU  - Biagi, Maria Chiara
AU  - Fumagalli, Laura
AU  - Gomila, Gabriel
PY  - 2016
UR  - https://hdl.handle.net/10481/101779
AB  - Lift-mode electrostatic force microscopy (EFM) is one of the most convenient imaging modes to
study the local dielectric properties of non-planar samples. Here we present the quantitative
analysis of this imaging mode. We introduce a method to...
LA  - eng
KW  - AFM
KW  - EFM
KW  - Dielectric Constant
KW  - Dielectrics
KW  - Non-Planar Surfaces
TI  - Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy
DO  - 10.1088/0957-4484/27/40/405706
ER  -