TY  - GEN 
AU  - Cervera Gontard, Lionel
AU  - Pizarro, Joaquín
AU  - Ruiz-Zafra, Ángel
AU  - Hernández-Saz, Jesús
PY  - 2020
UR  - https://hdl.handle.net/10481/101585
AB  - Tools for numerical simulation of transmission electron microscopy (TEM) images are frequently used to provide insight about the origin of contrast features, hence,
to understand and to measure correctly the properties of a material. We describe in...
LA  - eng
PB  - Elsevier
TI  - Simulation of transmission electron microscopy images using a generalized single-slice approach: The case of self-assembled quantum dots
DO  - 10.1016/j.matchar.2020.110312
ER  -