Time-Domain Characterization of Nematic Liquid Crystals Using Additive Manufacturing Microstrip Lines Mateos Ruiz, Pablo Pérez Escribano, Mario Hernández Escobar, Alberto Abdo Sánchez, Elena Márquez Segura, Enrique Martín Guerrero, Teresa M. Camacho Peñalosa, Carlos Broadband measurements Liquid crystals (LCs) Permittivity characterization This article presents a method for effectively characterizing the dielectric permittivity of nematic liquid crystals (LCs) across a broad frequency range. These materials show significant potential for reconfigurable devices operating in microwave and millimeter-wave frequencies. To achieve this goal, an additive manufacturing technique is used to create a microstrip line that can be filled with liquid that acts as its substrate. The LC is then biased to modulate its permittivity. After manufacturing, a time-gating approach is used to extract the permittivity, eliminating the need for in-fixture calibration, such as thru–reflect–line (TRL). Finally, the approach is validated through simulations and experimental results, which closely align with those reported using other methods in the bibliography. 2024-10-21T11:04:45Z 2024-10-21T11:04:45Z 2024-06-12 journal article P. Mateos-Ruiz et al., "Time-Domain Characterization of Nematic Liquid Crystals Using Additive Manufacturing Microstrip Lines," in IEEE Transactions on Instrumentation and Measurement, vol. 73, pp. 1-8, 2024, Art no. 6006908, doi: 10.1109/TIM.2024.3413162 https://hdl.handle.net/10481/96178 10.1109/TIM.2024.3413162 eng info:eu-repo/grantAgreement/EC/HE/MSC 101110031 http://creativecommons.org/licenses/by-nc-nd/4.0/ open access Attribution-NonCommercial-NoDerivatives 4.0 Internacional Institute of Electrical and Electronics Engineers (IEEE)