Time Domain Simulation of Common Mode Ferrite Chokes at System Level Gascón Bravo, Alberto González García, Salvador Muñoz Manterola, Alejandro Añón Cancela, Manuel Moreno, Roberto Tekbaş, Kenan Díaz Angulo, Luis Manuel Ferrite Time-domain analysis Complex permeability This article introduces a comprehensive methodology for analyzing common-mode (CM) ferrite chokes in time-domain (TD) methods, employing lumped dispersive loads, and validates it through a typical test setup for cable crosstalk assessment. The analysis begins with the experimental characterization of CM choke material properties using a coaxial line fixture to obtain its constitutive parameters. Subsequently, a simplified lumped dispersive convolutional model is obtained, representing the impedance of the ferrite when placed on a location on the cable. The first approach adopts a multiconductor transmission line (MTL) model for the cables, solving them by a finite-difference (FDTD) space-time scheme. The second approach utilizes the classical full-wave YeeFDTD method in conjunction with the thin-wire Holland model for cables. The accuracy of the proposed methods is evaluated by comparing simulations performed with MTL-FDTD and Holland-Yee FDTD, to experimental measurements, and results obtained with the the frequency-domain finite element method using a 3-D model of the ferrite with its constitutive parameters. Finally, the validity and performance of the methodologies are critically discussed. 2024-05-24T09:50:01Z 2024-05-24T09:50:01Z 2023-12 journal article A. Gascón Bravo, Salvador G. García, A. Muñoz Manterola, M. Añón-Cancela , R. Moreno, Kenan Tekbas, Luis D. Angulo, “Time Domain Simulation of Common Mode Ferrite Chokes at System Level,” in IEEE Transactions on Electromagnetic Compatibility, vol. 65, no. 6, pp. 1900-1908, Dec. 2023, DOI: 10.1109/TEMC.2023.3309698 https://hdl.handle.net/10481/92050 10.1109/TEMC.2023.3309698 eng http://creativecommons.org/licenses/by/4.0/ open access Creative Commons Attribution-NonCommercial-NoDerivs 3.0 License IEEE