<rdf:RDF xmlns:rdf="http://www.openarchives.org/OAI/2.0/rdf/" xmlns:ow="http://www.ontoweb.org/ontology/1#" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:ds="http://dspace.org/ds/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/rdf/ http://www.openarchives.org/OAI/2.0/rdf.xsd">
   <ow:Publication rdf:about="oai:digibug.ugr.es:10481/89226">
      <dc:title>Thermal Compact Modeling and Resistive Switching Analysis in Titanium Oxide-Based Memristors</dc:title>
      <dc:creator>Roldán Aranda, Juan Bautista</dc:creator>
      <dc:creator>Cantudo Gómez, Antonio</dc:creator>
      <dc:creator>Maldonado Correa, David</dc:creator>
      <dc:creator>Aguilera Pedregosa, Cristina</dc:creator>
      <dc:creator>Jiménez Molinos, Francisco</dc:creator>
      <dc:date>2024-02-16T07:25:02Z</dc:date>
      <dc:date>2024-02-16T07:25:02Z</dc:date>
      <dc:date>2024-02-15</dc:date>
      <dc:type>journal article</dc:type>
      <dc:identifier>ACS Applied Electronics Materials, https://doi.org/10.1021/acsaelm.3c01727</dc:identifier>
      <dc:identifier>https://hdl.handle.net/10481/89226</dc:identifier>
      <dc:identifier>10.1021/acsaelm.3c01727</dc:identifier>
      <dc:language>eng</dc:language>
      <dc:rights>http://creativecommons.org/licenses/by/4.0/</dc:rights>
      <dc:rights>open access</dc:rights>
      <dc:rights>Atribución 4.0 Internacional</dc:rights>
      <dc:publisher>American Chemical Society</dc:publisher>
   </ow:Publication>
</rdf:RDF>