Rule-Based Design for Low-Cost Double-Node Upset Tolerant Self-Recoverable D-Latch Hatefinasab, Seyedehsomayeh Morales Santos, Diego Pedro Castillo Morales, María Encarnación Rodríguez Santiago, Noel Delay-power-area product (DPAP) Double node upsets (DNU) High impedance state (HIS) Low cost single event double node upset tolerant (LSEDUT) Power-delay product (PDP) Single node upset (SNU) Soft error (SE) This paper presents a low-cost, self-recoverable, double-node upset tolerant latch aiming at nourishing the lack of these devices in the state of the art, especially featuring self-recoverability while maintaining a low-cost pro le. Thus, this D-latch may be useful for high reliability and high-performance safety-critical applications as it can detect and recover faults happening during holding time in harsh radiation environments. The proposed D-latch design is based on a low-cost single event double-node upset tolerant latch and a rule-based double-node upset (DNU) tolerant latch which provides it with the self-recoverability against DNU, but paired with a low transistor count and high performance. Simulation waveforms support the achievements and demonstrate that this new D-latch is fully self-recoverable against double-node upset. In addition, the minimum improvement of the delay-power-area product of the proposed rule-based design for the low-cost DNU tolerant self-recoverable latch (RB-LDNUR) is 59%, compared with the latest DNU self-recoverable latch on the literature. 2023-02-10T11:55:15Z 2023-02-10T11:55:15Z 2023-01-03 journal article S. Hatefinasab... [et al.]. "Rule-Based Design for Low-Cost Double-Node Upset Tolerant Self-Recoverable D-Latch," in IEEE Access, vol. 11, pp. 1732-1741, 2023, doi: [10.1109/ACCESS.2022.3233812] https://hdl.handle.net/10481/79822 10.1109/ACCESS.2022.3233812 eng http://creativecommons.org/licenses/by/4.0/ open access Atribución 4.0 Internacional IEEE