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   <ow:Publication rdf:about="oai:digibug.ugr.es:10481/64241">
      <dc:title>Electron Microscopy: SEM/TEM</dc:title>
      <dc:creator>Nieto García, Fernando</dc:creator>
      <dc:creator>Jiménez-Millán, Juan</dc:creator>
      <dc:creator>Gambogi Parreira, Gleydes</dc:creator>
      <dc:creator>Chiarini-Garcia, H.</dc:creator>
      <dc:creator>Netto Melo, R.C.</dc:creator>
      <dc:subject>SEM</dc:subject>
      <dc:subject>TEM</dc:subject>
      <dc:subject>Instrumentación</dc:subject>
      <dc:subject>Secondary electrons</dc:subject>
      <dc:subject>Backscattered electrons</dc:subject>
      <dc:subject>Lattice fringes</dc:subject>
      <dc:description>The basics of image formation and instrumentation on Scanning and Transmission Electron Microscopy are presented. The various types of signals in both modes are explained, together with the kind of information, which can be obtained from them</dc:description>
      <dc:description>Se presentan los conceptos básicos sobre la formación de imágenes e instrumentación en microscopía electrónica de barrido y transmisión. Se explican los distintos tipos de señales en ambos modos, junto con el tipo de información que se puede obtener de cada una de ellas.</dc:description>
      <dc:date>2020-11-13T07:09:57Z</dc:date>
      <dc:date>2020-11-13T07:09:57Z</dc:date>
      <dc:date>2010</dc:date>
      <dc:type>info:eu-repo/semantics/bookPart</dc:type>
      <dc:identifier>Physics in Medicine and Biology  (R. Splinter, ed.)  40,1-11.</dc:identifier>
      <dc:identifier>http://hdl.handle.net/10481/64241</dc:identifier>
      <dc:language>eng</dc:language>
      <dc:rights>http://creativecommons.org/licenses/by-nc-nd/3.0/es/</dc:rights>
      <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
      <dc:rights>Atribución-NoComercial-SinDerivadas 3.0 España</dc:rights>
      <dc:publisher>CRC Press, New York</dc:publisher>
   </ow:Publication>
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