Generation of arbitrarily patterned polarizers using 2-photon polymerization
Metadatos
Mostrar el registro completo del ítemAutor
Ganazhapa, Byron; Pereiro-García, Javier; Quintana Arregui, Xabier; Andreas Geday, Morten; Guadaño, Gonzalo; Caño-García, ManuelEditorial
Nature Research
Fecha
2024-09-29Referencia bibliográfica
Ganazhapa, B. et. al. Sci Rep 14, 22550 (2024). [https://doi.org/10.1038/s41598-024-73946-z]
Patrocinador
Comunidad de Madrid through the “PANTOMIME” (APOYO-JOVENES-21-9FOMOQ-22-0CNGFM); “DISEÑO Y FABRICACIÓN DE DISPOSITIVOS FOTÓNICOS” (BEAGALINDO-21-QU81R4-7-0QQBF3); “Ayudas para la realización de Doctorados Industriales de la Comunidad de Madrid” (IND2020/TIC-17424); Spanish Government, “ENHANCE-5G” (PID2020-114172RB-C22), “LC-LENS” (PDC2021-121370-C21), “DISRADIO” (TSI-063000-2021-83) and WOW-2D (PLEC2022-009381); EU project G.A 101004462 and “CONCEPT-2D” (G.A. 101062995), financed by the European Union; European Space Agency (ESA) with the “Smart Heaters” project (4000133048/20/NL/KML)Resumen
Patterned polarizers are prepared using liquid crystals (LC) doped with a black dichroic dye and in
combination with a linear polarizer. The pattern is achieved with a nanostructured LC alignment
surface, that is generated using a two-photon polymerization direct laser write (2PP-DLW). This
technique creates a pattern of high-resolution grooves in the photoresist at any arbitrary angle.
The angle governs the LC orientation at any substrate surface point, determining the transmitted
light linear polarization angle. This paper presents the first use of a 2PP-DLW cured positive tone
photoresist for dichroic dye-doped LC alignment. Two complementary photoresists have been
employed: conventional negative tone SU-8 photoresist and, in this context novel, positive tone S1805
photoresist. The alignment quality of the polarizers has been assessed by analyzing the transmission
using an additional polarizer. For SU-8, the resulting grayscale pattern and a contrast ratio (CR) of
14 has measured. The uniformity of the alignment has been measured to be 65% using normalized
Shannon entropy (H). For S1805, a CR of 37 was measured, and a uniformity of 63% was obtained. 2PPDLW
allows for shaping complex patterns in submicron dimensions and for the fabrication of arbitrarily
patterned polarizers and other LC devices.