| dc.contributor.author | Perucchini, Marta | |
| dc.contributor.author | González Marín, Enrique | |
| dc.date.accessioned | 2022-01-27T07:47:36Z | |
| dc.date.available | 2022-01-27T07:47:36Z | |
| dc.date.issued | 2022-01-05 | |
| dc.identifier.citation | Perucchini, M... [et al.]. Electronic Transport in 2D-Based Printed FETs from a Multiscale Perspective. Adv. Electron. Mater. 2022, 2100972. [https://doi.org/10.1002/aelm.202100972] | es_ES |
| dc.identifier.uri | http://hdl.handle.net/10481/72505 | |
| dc.description | The authors gratefully acknowledge the ERC PEP2D (contract no. 770047) and H2020 WASP (contract no. 825213) and the Crosslab Department of Excellence project for financial support. E.G.M. also acknowledges the support by the Spanish MCI through the project PID2020-116518GB-I00 and by the Junta de Andalucia-Consejeria de Economia y Conocimiento/FEDER-EU through the Project A-TIC-646-UGR20.
Open access funding provided by Universita degli Studi di Pisa within the CRUI-CARE Agreement. | es_ES |
| dc.description.abstract | As 2D materials (2DMs) gain the research limelight as a technological option
for obtaining on-demand printed low-cost integrated circuits with reduced
environmental impact, theoretical methods able to provide the necessary
fabrication guidelines acquire fundamental importance. Here, a multiscale
modeling technique is exploited to study electronic transport in devices
consisting of a printed 2DM network of flakes. The approach implements a
Monte Carlo scheme to generate the flake distribution. By means of ab initio
density functional theory calculations together with non equilibrium Green’s
functions formalism, detailed physical insights on flake-to-flake transport
mechanisms are provided. This later feeds a 3D drift-diffusion and Poisson
solution to compute self-consistently transport and electrostatics in the
device. The method is applied to MoS2 and graphene-based dielectrically
gated FETs, highlighting the impact of the structure density and variability on
the mobility and sheet resistance. The prediction capability of the proposed
approach is validated against electrical measurements of in-house printed
graphene conductive lines as a function of film thickness, demonstrating its
strong potential as a guide for future experimental activity in the field. | es_ES |
| dc.description.sponsorship | ERC PEP2D 770047 | es_ES |
| dc.description.sponsorship | H2020 WASP 825213 | es_ES |
| dc.description.sponsorship | Crosslab Department of Excellence project | es_ES |
| dc.description.sponsorship | Spanish Government PID2020-116518GB-I00 | es_ES |
| dc.description.sponsorship | Junta de Andalucia-Consejeria de Economia y Conocimiento/FEDER-EU A-TIC-646-UGR20 | es_ES |
| dc.description.sponsorship | Universita degli Studi di Pisa within the CRUI-CARE Agreement | es_ES |
| dc.language.iso | eng | es_ES |
| dc.publisher | Wiley | es_ES |
| dc.rights | Atribución 3.0 España | * |
| dc.rights.uri | http://creativecommons.org/licenses/by/3.0/es/ | * |
| dc.subject | 2D materials | es_ES |
| dc.subject | Drift-diffusion | es_ES |
| dc.subject | Field-effect transistor | es_ES |
| dc.subject | Multi-scale simulations | es_ES |
| dc.subject | Network | es_ES |
| dc.subject | Printable electronics | es_ES |
| dc.title | Electronic Transport in 2D-Based Printed FETs from a Multiscale Perspective | es_ES |
| dc.type | journal article | es_ES |
| dc.relation.projectID | info:eu-repo/grantAgreement/EC/H2020/770047 | es_ES |
| dc.relation.projectID | info:eu-repo/grantAgreement/EC/H2020/825213 | es_ES |
| dc.rights.accessRights | open access | es_ES |
| dc.identifier.doi | 10.1002/aelm.202100972 | |
| dc.type.hasVersion | VoR | es_ES |