Quantum Enhancement of a S/D Tunneling Model in a 2D MS-EMC Nanodevice Simulator: NEGF Comparison and Impact of Effective Mass Variation
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AuthorMedina Bailón, Cristina; Carrillo-Nunez, Hamilton; Lee, Jaehyun; Sampedro Matarín, Carlos; Padilla de la Torre, José Luis; Donetti, Luca; Georgiev, Vihar; Gámiz Pérez, Francisco Jesús; Asenov, Asen
Direct source-to-drain tunnelingTransport effective massConfinement effective massMulti-subband ensemble Monte CarloNon-equilibrium Green’s functionDGSOIFinFET
Medina-Bailon, C.; Carrillo-Nunez, H.; Lee, J.; Sampedro, C.; Padilla, J.L.; Donetti, L.; Georgiev, V.; Gamiz, F.; Asenov, A. Quantum Enhancement of a S/D Tunneling Model in a 2D MS-EMC Nanodevice Simulator: NEGF Comparison and Impact of Effective Mass Variation. Micromachines 2020, 11, 204. [doi:10.3390/mi11020204]
SponsorshipThis project has received funding from EPSRC UKRI Innovation Fellowship scheme under grant agreement No. EP/S001131/1 (QSEE) and No. EP/P009972/1 (QUANTDEVMOD).
As complementary metal-oxide-semiconductor (CMOS) transistors approach the nanometer scale, it has become mandatory to incorporate suitable quantum formalism into electron transport simulators. In this work, we present the quantum enhancement of a 2D Multi-Subband Ensemble Monte Carlo (MS-EMC) simulator, which includes a novel module for the direct Source-to-Drain tunneling (S/D tunneling), and its verification in the simulation of Double-Gate Silicon-On-Insulator (DGSOI) transistors and FinFETs. Compared to ballistic Non-Equilibrium Green’s Function (NEGF) simulations, our results show accurate I D vs. V GS and subthreshold characteristics for both devices. Besides, we investigate the impact of the effective masses extracted Density Functional Theory (DFT) simulations, showing that they are the key of not only the general thermionic emission behavior of simulated devices, but also the electron probability of experiencing tunneling phenomena.