Microscopía electrónica de barrido (SEM) con microanálisis EDX y WDX
| dc.contributor.author | Nieto García, Fernando | |
| dc.date.accessioned | 2025-11-10T10:52:13Z | |
| dc.date.available | 2025-11-10T10:52:13Z | |
| dc.date.issued | 2021 | |
| dc.identifier.uri | https://hdl.handle.net/10481/107887 | |
| dc.language.iso | spa | es_ES |
| dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
| dc.title | Microscopía electrónica de barrido (SEM) con microanálisis EDX y WDX | es_ES |
| dc.type | lecture | es_ES |
| dc.rights.accessRights | open access | es_ES |
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